Method according refinement quantization by the Rietveld method
ICDD database / JCPD
SEB-EDX
Environmental Scanning Electron Microscope (ESEM) coupled to an energy dispersive X-ray microprobe (EDX)
High vacuum and low vacuum mode for conductive and insulating samples – Secondary and backscattered electron detector (for chemical and topographical contrast) – Semi-quantitative EDX chemical analysis (peak mode, cartography, element detection down to Boron)
ICP - MS
ICP-MS Spectrometer equipped with a Dynamic Reaction Cell (DRC)
Quadrupole, detection threshold down to ppt, HF solution Teflon injection system, isotopic ratio
Stationary Optical Emission Spectrometer (OES) or Spark Spectrometer for metal analysis
Iron base, Aluminium base, Copper base. Block analysis: surface area over 1cm2 and thickness greater than 0.5 mm.
Element Analyser
C / S, N / O and H Element Analyser
C / S analysis by dry combustion and infra-red detection, N / O analysis by thermal conductivity and infra-red detection, H analysis by combustion and thermal conductivity measurement
Your contact person
Emmanuel BUIRET emmanuelbuiret@filab.fr
The FILAB Advantage
Accredited by COFRAC (see www.cofrac.fr)
Authorised by Safran Group
